Notes on S.M.A.R.T.
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S.M.A.R.T only info
All available info
Lifetime/age
Useful information to determine lifetime/age in section SMART Attributes Data
Structure revision number: X
, atribute with id 9 and name Power_On_Hours
.
Value is stored in field RAW_VALUE
usually in units hours. Simple way to test
the units is of course to keep the disk rotating (no read/writes needed) and
check for changes in the attribute 9:
Also, perform a short test with
When done, output all info again and look for section that report overall test
results, it starts with string SMART Extended Self-test Log Version:
. The
field LifeTime(hours)
will report the lifetime of the disk when the test was
performed.
Another way is to output all info again, and look for temperature history info.
Section starts with string SCT Temperature History Version
. It shows a
timestamped log of temperature of disk.
Test
Start long test
Monitor progress
Read from disk every n seconds to keep it from going to standby
After test is done view results via either
Misc
-
Fedora packages:
smartmontools
&gsmartcontrol
. -
Systemctl service unit:
smartd.service
-
Not all USB devices supported, see Smartmontools USB Device Support.
-
If the partition is NTFS the problem might be with partition itself not with the disk. Check the disk on Windows with
chkdsk
, see references for links. You may see a message like ths on Linux:ntfs_attr_pread_i: ntfs_pread failed: Input/output error Failed to read NTFS $Bitmap: Input/output error NTFS is either inconsistent, or there is a hardware fault, or it's a SoftRAID/FakeRAID hardware. In the first case run chkdsk /f on Windows then reboot into Windows twice. The usage of the /f parameter is very important! If the device is a SoftRAID/FakeRAID then first activate it and mount a different device under the /dev/mapper/ directory, (e.g. /dev/mapper/nvidia_eahaabcc1). Please see the 'dmraid' documentation for more details.
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It looks like S.M.A.R.T. diagnostic data is not as useful as initially thought, the following is quoted from Failure Trends in a Large Disk Drive Population
…we find that failure prediction models based on SMART parameters alone are likely to be severely limited in their prediction accuracy, given that a large fraction of our failed drives have shown no SMART error signals whatsoever. This result suggests that SMART models are more useful in predicting trends for large aggregate populations than for individual components. It also suggests that powerful predictive models need to make use of signals beyond those provided by SMART.